Force-deflection spectroscopy: a new method to determine the Young's modulus of nanofilaments.
Force-deflection spectroscopy: a new method to determine the Young's modulus of nanofilaments.
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DOI：
10.1021/nl060978f
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发表时间：
2006-08
期刊：
影响因子：
10.8
通讯作者：
Q. Xiong;N. Duarte;Srinivas Tadigadapa;Peter C. Eklund
中科院分区：
文献类型：
--
作者：
Q. Xiong;N. Duarte;Srinivas Tadigadapa;Peter C. Eklund
我们证明了通过一种新的方法，即力偏转光谱（FDS）的纳米线或纳米管的杨氏模量的测定。使用原子力显微镜测量桥接在Si衬底中图案化的沟槽的纳米丝的力与偏转（F-D）曲线。然后将FD数据拟合至Euler-Bernoulli方程以确定杨氏模量。我们的方法提供了一个通用的平台，从它来研究各种材料在纳米级的机械和压电性能。ZnS（纤锌矿）纳米线上的杨氏模量测量演示这种技术。我们发现，矩形横截面ZnS纳米带的杨氏模量为52 +/- 7.0 GPa，约30%小于散装报告。
We demonstrate the determination of Young's modulus of nanowires or nanotubes via a new approach, that is, force-deflection spectroscopy (FDS). An atomic force microscope is used to measure force versus deflection (F-D) curves of nanofilaments that bridge a trench patterned in a Si substrate. The FD data are then fit to the Euler-Bernoulli equation to determine Young's modulus. Our approach provides a generic platform from which to study the mechanical and piezoelectric properties of a variety of materials at the nanoscale level. Young's modulus measurements on ZnS (wurtzite) nanowires are presented to demonstrate this technique. We find that the Young's modulus for rectangular cross section ZnS nanobelts is 52 +/- 7.0 GPa, about 30% smaller than that reported for the bulk.