Crystal structure and orientation of organic semiconductor thin films by microcrystal electron diffraction and grazing-incidence wide-angle X-ray scattering
Crystal structure and orientation of organic semiconductor thin films by microcrystal electron diffraction and grazing-incidence wide-angle X-ray scattering
复制标题
DOI：
10.1039/d0cc00119h
复制
发表时间：
2020-04-18
影响因子：
4.9
通讯作者：
Nannenga, Brent L.
中科院分区：
文献类型：
--
作者：
Levine, Andrew M.;Bu, Guanhong;Nannenga, Brent L.
我们使用微晶电子衍射（MicroED），以确定三个有机半导体的结构，并表明这些结构可以使用沿着与掠入射广角X射线散射（GIWAXS），以了解薄膜中的晶体包装和取向。这些互补技术一起为有机半导体薄膜提供了独特的结构见解，这类材料的器件特性和电子行为敏感地依赖于固态秩序。
We use microcrystal electron diffraction (MicroED) to determine structures of three organic semiconductors, and show that these structures can be used along with grazing-incidence wide-angle X-ray scattering (GIWAXS) to understand crystal packing and orientation in thin films. Together these complimentary techniques provide unique structural insights into organic semiconductor thin films, a class of materials whose device properties and electronic behavior are sensitively dependent on solid-state order.