Temperature-Dependent EUV Spectra of Xenon Plasmas Observed in the Compact Helical System
Temperature-Dependent EUV Spectra of Xenon Plasmas Observed in the Compact Helical System
复制标题
在紧凑螺旋系统中观察到的与温度相关的氙等离子体 EUV 光谱
DOI：
10.1585/jspf.81.480
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发表时间：
2005
期刊：
影响因子：
--
通讯作者：
H. Ogawa
中科院分区：
文献类型：
--
作者：
C. Suzuki;H. Nishimura;M. Ochiai;T. Kato;S. Okamura;R. More;K. Nishihara;M. Nakai;K. Shigemori;S. Fujioka;H. Ogawa
利用掠入射光谱仪测量了致密螺旋系统(CHS)中氙气(Xe)等离子体的极紫外(EUV)辐射，光谱分辨率为0.05 nm。用激光汤姆逊散射诊断系统测量了等离子体的电子密度和温度的空间分布。不同的电子温度对光谱特征有显著的影响，这是由于等离子体中Xe离子的主电荷态不同所致。
We carried out spectroscopic measurements of extreme ultraviolet (EUV) emissions from xenon (Xe) plasmas generated in the Compact Helical System (CHS) by a grazing incidence spectrometer with a spectral resolution of 0.05 nm. Spatial pro les of the electron density and temperature of the plasmas have been measured by laser Thomson scattering diagnostic system. A remarkable variation in spectral features by different electron temperatures was observed, and was attributed to the difference in dominant charge states of Xe ions in the plasma.