Implementation of moiré-schlieren deflectometry on a small scale fast capillary plasma discharge

Implementation of moiré-schlieren deflectometry on a small scale fast capillary plasma discharge
复制标题

莫尔纹影偏转测量在小规模快速毛细管等离子体放电中的应用

DOI:
10.1063/1.4719982
复制
发表时间:
2012
影响因子:
3.2
通讯作者:
H. Bhuyan
H. Bhuyan
中科院分区:
物理与天体物理3区
文献类型:
--
作者:
J. Valenzuela;E. Wyndham;H. Chuaqui;D. Cortés;M. Favre;H. Bhuyan

文献摘要

参考文献

被引文献

相似文献

我们提出了一个实施折射诊断的结果,以研究毛细管放电的快速动力学。它由云纹纹影偏转仪技术组成,它提供了对折射率梯度的定量分析。该技术由角度偏转测绘系统(莫尔偏转仪)和空间傅里叶滤波器(纹影)组成。其时间分辨率为12ps,空间分辨率为50μm,最小可探测梯度(∇n e)m in=6×10 18 cm-4。利用这些参数,研究了15 ns半周期电流的大长宽比毛细管放电,并对内径1.6 mm、长21 mm的氧化铝管进行了轴向诊断。在此条件下可探测到的电子密度为1×1017 cm-3。通过对条纹位移的解释,我们可以测量出径向压缩波的速度和洛伦兹力的压缩比。在轴上,在软X射线发射最大时,获得了5×10 17 cm-3量级的电子密度。
We present the results of an implementation of a refractive diagnostic to study fast dynamics in capillary discharges. It consists of a moire-schlieren deflectometry technique that provides a quantitative analysis of the refractive index gradients. The technique is composed of an angular deflection mapping system (moire deflectometry) and a spatial Fourier filter (schlieren). Temporal resolution of 12 ps, 50 μm of spatial resolution and minimum detectable gradient of ( ∇ n e ) min = 6 × 10 18 cm - 4 were obtained. With these parameters, a large aspect ratio capillary discharge of 15 ns half period current was studied; the diagnostic was implemented axially along the alumina tube of 1.6 mm inner diameter and 21 mm length. The detectable electron density for these conditions was 1 × 10 17 cm - 3 . From the interpretation of the fringe displacement, we are able to measure the velocity of the radial compression wave and the compression ratio due to the Lorentz force. On axis, electron densities of the order of 5 × 10 17 cm - 3 were obtained at the time of maximum soft x-ray emission.
DOI: 10.1364/ol.25.000010
发表时间: 2000
期刊: Optics letters
影响因子: 3.6
作者:
T. Hosokai;M. Kando;H. Dewa;H. Kotaki;S. Kondo;N. Hasegawa;K. Nakajima;K. Horioka
通讯作者: T. Hosokai;M. Kando;H. Dewa;H. Kotaki;S. Kondo;N. Hasegawa;K. Nakajima;K. Horioka