Frustration of direct photoionization of Ar clusters in intense extreme ultraviolet pulses from a free electron laser
Frustration of direct photoionization of Ar clusters in intense extreme ultraviolet pulses from a free electron laser
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DOI：
10.1088/0953-4075/42/13/134019
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发表时间：
2009-07-14
影响因子：
1.6
通讯作者：
Kimura, H.
中科院分区：
文献类型：
--
作者：
Iwayama, H.;Nagaya, K.;Kimura, H.
我们测量了暴露于强极紫外自由电子激光脉冲（lambda 类似于 61 nm，I 类似于 1.3 x 10(11) W cm(-2)）的 Ar 簇（平均簇大小 < N > 类似于 10-600）的碎片离子的动能。对于小团簇（<N>小于或接近200），离子的平均动能随着团簇尺寸的增加而强烈增加，表明多重电离的促进，而当<N>大于或接近200时，观察到平均动能饱和。考虑到有多少光电子可以从团簇逃逸，发现离子动能的尺寸依赖性表现出直接电离的挫败性。 光电离，这是由高度电离团簇的强库仑势产生的。
We have measured the kinetic energies of fragment ions from Ar clusters (average cluster size < N > similar to 10-600) exposed to intense extreme ultraviolet free electron laser pulses (lambda similar to 61 nm, I similar to 1.3 x 10(11) W cm(-2)). For small clusters (< N > less than or similar to 200), the average kinetic energy of ions strongly increases with increasing the cluster size, indicating a promotion of the multiple ionization, whereas the average kinetic energy is observed to be saturated for < N > greater than or similar to 200. Considering how many photoelectrons can escape from the cluster, it was found that the size dependence of the ion kinetic energy exhibited the frustration of direct photoionization, which resulted from the strong Coulomb potential of the highly ionized cluster.