Modulation of field emission properties of vertically aligned ZnO nanorods with aspect ratio and number density
Modulation of field emission properties of vertically aligned ZnO nanorods with aspect ratio and number density
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DOI：
10.1016/j.apsusc.2008.12.033
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发表时间：
2009-02
影响因子：
6.7
通讯作者：
R. Gayen;S. Dalui;A. Rajaram;A. Pal
中科院分区：
文献类型：
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作者：
R. Gayen;S. Dalui;A. Rajaram;A. Pal
采用混合湿化学法合成了不同长径比的垂直排列ZnO纳米棒阵列。研究了ZnO纳米棒的场发射性能随长径比的变化规律。在7.0V/μm时，随着长径比的增加，发射电流密度从0.02 μA/cm 2增加到8μA/cm 2。当电流密度为10μA/cm 2时，随着ZnO薄膜长径比的增加，薄膜的开启电压从9.6 V/μm下降到7 V/μm。FE特性（发射阈值、电流密度、表面均匀性等）之间的相互关系利用扫描电子显微镜（SEM）和原子力显微镜（AFM）对ZnO纳米结构进行了表征。利用拉曼光谱和傅立叶变换红外光谱（FTIR）对ZnO纳米棒的质量进行了检测。结果发现，所观察到的FE特性的增强，可以主要归因于在ZnO纳米棒的纵横比和相关的数密度的增加。
Vertically aligned ZnO nanorod arrays with different aspect ratios were synthesized by hybrid wet chemical route. Modulation of the field emission properties (FE) with aspect ratio of ZnO nanorods was examined. With the increase in the aspect ratio, the emission current density increases from 0.02 to 8μA/cm2at 7.0V/μm. Turn-on voltage was seen to decrease from 9.6 to 7V/μm at a current density of 10μA/cm2with the increase in aspect ratio in the ZnO films. The interrelation between the FE characteristics (emission thresholds, current density, surface uniformity, etc.) and microstructure of the ZnO nanostructure obtained from scanning electron microscopy (SEM) and atomic force microscopy (AFM) was discussed. Quality of the ZnO nanorods was also examined by using Raman spectroscopy and Fourier transformed infrared spectroscopy (FTIR). It was found that the observed enhancements of FE characteristics could mainly be attributed to the increase in aspect ratio and associated number density of ZnO nanorods.