Atomic force microscopy of menisci of free-standing smectic films
Atomic force microscopy of menisci of free-standing smectic films
复制标题
独立近晶薄膜半月板的原子力显微镜
DOI：
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发表时间：
2011
期刊：
影响因子：
--
通讯作者：
R. Stannarius
中科院分区：
文献类型：
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作者：
K. Harth;B. Schulz;C. Bahr;R. Stannarius
用原子力显微镜和光学干涉仪研究了自由悬浮近晶薄膜的晶面轮廓。测得的弯月面轮廓显示两个不同的区域：在较厚的区域中的圆形形状和平面膜区域的边缘附近的几乎线性的斜率。发现弯月面与平膜之间存在几度的宏观接触角。在近晶C相中和在接近向近晶C转变的近晶A相中，薄膜晶体被Meyer和Pershan首先描述的特征条纹图案装饰[Solid State Commun.，1973，13，989-992]。我们发现，这些结构的周期性扭曲的指向矢场伴随着显着的凹凸不平的弯月面，与条纹周期的百分之几的高度调制。通过比较AFM和偏光显微镜图像的细节特征，我们揭示了它们与指向矢结构的相关性。我们收集的论点对经典的表面张开模型的有效性。
The profile of menisci of freely suspended smectic films is studied by atomic force microscopy and optical interferometry. The measured meniscus profiles show two distinct regions: a circular shape in thicker regions and an almost linear slope near the edge of the planar film area. A macroscopic contact angle of several degrees is found between the meniscus and flat film. In the smectic C phase and in smectic A close to a transition to smectic C, film menisci are decorated by a characteristic stripe pattern that was first described by Meyer and Pershan [Solid State Commun., 1973, 13, 989–992]. We find that the periodically distorted director field of these structures is accompanied by remarkable undulations of the meniscus surface, with height modulations of a few percent of the stripe period. By comparison of detailed features of AFM and polarization microscopy images, we reveal their correlation with the director structures. We collect arguments against the validity of the classical surface splay model.
DOI：
10.1073/pnas.0407925101
发表时间：
2004-12-14
影响因子：
11.1
作者：
Choi, MC;Pfohl, T;Safinya, CR
通讯作者：
Safinya, CR