Y.Takai et.al.: ""Accurate Measurement of Information limit in TEM by Three Dimensional Power Spectrum"" 6th Asia-Pacific Conference on Electron Microscopy. 1. 75-76 (1996)
Y.Takai et.al.: ""Accurate Measurement of Information limit in TEM by Three Dimensional Power Spectrum"" 6th Asia-Pacific Conference on Electron Microscopy. 1. 75-76 (1996)
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Y.Takai 等人：“通过三维功率谱精确测量 TEM 中的信息极限”，第六届亚太电子显微镜会议。
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