Measurements of the minimum elevation of nano-particles by 3D nanoscale tracking using ratiometric evanescent wave imaging
Measurements of the minimum elevation of nano-particles by 3D nanoscale tracking using ratiometric evanescent wave imaging
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使用比例倏逝波成像通过 3D 纳米级跟踪测量纳米粒子的最小高度
DOI：
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发表时间：
2006
期刊：
影响因子：
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通讯作者：
K. D. Kihm
中科院分区：
文献类型：
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作者：
C. Margraves;C. Choi;K. D. Kihm
在与基底玻璃表面的双电层相互作用下，研究了盐水浓度对纳米颗粒最小高度的影响。使用比率全内反射荧光显微镜 (R-TIRFM) 可以对距离表面不到 1 μm 的近壁区域中的纳米颗粒进行三维跟踪。最小高程测量是针对半径为 100、250 和 500 nm 的聚苯乙烯荧光纳米球 (SG = 1.05) 进行的，盐度范围为 0.1 至 10 mM。特别注意通过对玻璃基板进行精心的超声处理和冲洗来确保清洁的表面条件。还必须仔细检查激光照射强度和持续时间，以尽量减少颗粒荧光发射的光漂白。据报道，最低海拔随着盐水浓度的增加和颗粒尺寸的增加而降低，据作者所知，这是第一次通过实验和定量的方法。
Effect of saline concentration on the minimum elevation of nanoparticles has been examined under the electric double layer interactions with the substrate glass surface. The use of ratiometric total internal reflection fluorescence microscopy (R-TIRFM) allows three-dimensional tracking of nanoparticles in the near-wall region within less than 1 μm from the surface. The measurements of minimum elevation were made for polystyrene fluorescent nanospheres of 100, 250, and 500 nm in radii (SG = 1.05) for the salinity ranging from 0.1 to 10 mM. Special care was taken to insure cleaned surface conditions by elaborate sonication and rinsing of the glass substrate. The laser illumination intensity and duration also had to be carefully examined to minimize photobleaching of the fluorescence emission from particles. It is reported that the minimum elevation decreases with increasing saline concentration and with increasing particle sizes, for the first time experimentally and quantitatively to the authors’ knowledge.