Recent Developments in Focused Ion Beam and its Application in Nanotechnology

Recent Developments in Focused Ion Beam and its Application in Nanotechnology
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DOI:
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发表时间:
2016
影响因子:
1.5
通讯作者:
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中科院分区:
材料科学4区
文献类型:
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作者:
Wei Han;Dongguang Wei;Huisheng Jiao;Haifeng Gao;

文献摘要

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