Augmenting Grid-Based Contours to Improve Thin-Plate DEM Generation
Augmenting Grid-Based Contours to Improve Thin-Plate DEM Generation
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DOI：
10.14358/pers.71.1.69
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发表时间：
2005
影响因子：
1.3
通讯作者：
Michael B. Gousie;W. R. Franklin
中科院分区：
文献类型：
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作者：
Michael B. Gousie;W. R. Franklin
我们提出了两个新的预处理技术，提高薄板数字高程模型（DEM）近似基于网格的轮廓数据。一种方法从初始插值或近似表面计算梯度。这些方面用于创建使用Catmull-Rom样条插值的渐变路径。计算出的高程将添加到初始等高线数据集。薄板法适用于所有的数据。样条线允许信息跨轮廓流动，从而改进最终曲面。第二种方法连续计算新的，中间轮廓之间现有的等值线，提供额外的数据，为后续的薄板加工。这两种方法都减轻了之前薄板方法中可见的伪影。表面测试与公布的方法，以显示定性和定量的改进，比以前的方法。
We present two new pre-processing techniques that improve thin plate Digital Elevation Model (DEM) approximations from grid-based contour data. One method computes gradients from an initial interpolated or approximated surface. The aspects are used to create gradient paths that are interpolated using Catmull-Rom splines. The computed elevations are added to the initial contour data set. Thin plate methods are applied to all of the data. The splines allow information to flow across contours, improving the final surface. The second method successively computes new, intermediate contours in between existing isolines, which provide additional data for subsequent thin plate processing. Both methods alleviate artifacts visible in previous thin plate methods. The surfaces are tested with published methods to show qualitative and quantitative improvements over previous methods.