Complex design of dissipation signals in non-contact atomic force microscopy
Complex design of dissipation signals in non-contact atomic force microscopy
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DOI：
10.1039/c2cp43121a
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发表时间：
2012-01-01
影响因子：
3.3
通讯作者：
Kantorovich, L.
中科院分区：
文献类型：
--
作者：
Bamidele, J.;Li, Y. J.;Kantorovich, L.
通过理论和实验相结合的方法，研究了非接触原子力显微镜（NC-AFM）中形貌和耗散信号之间的复杂相互作用，并将其应用于易失稳的Si（001）表面。考虑到广泛的尖端样品分离到近接触制度和几个尖端模型，刚性和更灵活的，一个复杂的体系结构的磁滞回线在模拟的尖端力-距离曲线被揭示。在小的尖端表面距离的耗散被发现是由两个相关的贡献，由于表面和尖端。这些都伴随着相应的表面和尖端变形的方法收回动力学。从理论模拟中得出的定性结论，如大的耗散信号（> 1.0 eV）和依赖于尖端-表面距离的阶梯状耗散广泛支持的实验观察。针对所得结果，我们还讨论了NC-AFM成像的再现性。
Complex interplay between topography and dissipation signals in Non-Contact Atomic Force Microscopy (NC-AFM) is studied by a combination of state-of-the-art theory and experiment applied to the Si(001) surface prone to instabilities. Considering a wide range of tip-sample separations down to the near-contact regime and several tip models, both stiff and more flexible, a sophisticated architecture of hysteresis loops in the simulated tip force-distance curves is revealed. At small tip-surface distances the dissipation was found to be comprised of two related contributions due to both the surface and tip. These are accompanied by the corresponding surface and tip distortion approach-retraction dynamics. Qualitative conclusions drawn from the theoretical simulations such as large dissipation signals (> 1.0 eV) and a step-like dissipation dependent on the tip-surface distance are broadly supported by the experimental observations. In view of the obtained results we also discuss the reproducibility of NC-AFM imaging.