In-situ reduction by Joule heating and measurement of electrical conductivity of graphene oxide in a transmission electron microscope
In-situ reduction by Joule heating and measurement of electrical conductivity of graphene oxide in a transmission electron microscope
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DOI：
10.1088/2053-1583/abedc9
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发表时间：
2021-10-01
期刊：
影响因子：
5.5
通讯作者：
Arenal, Raul
中科院分区：
文献类型：
--
作者：
Hettler, Simon;Sebastian, David;Arenal, Raul
使用原位透射电子显微镜 (TEM) 通过焦耳加热还原氧化石墨烯 (GO)。该方法允许通过电学测量同时研究 GO 的电导率，并通过 TEM、电子衍射和电子能量损失光谱研究其在整个还原过程中的成分和结构特性。在低施加电流下观察到的 GO 特性的微小变化归因于扩散过程的促进。实际的还原过程从施加约2 x 10(14) Wm(-3) 的功率密度开始，并以高度均匀和局部的方式发生。电导率增加超过 4 个数量级，达到 3 x 10(3) Sm-1 的值，最终 O 含量低于 1%。我们讨论热退火和焦耳加热还原之间的差异。
Graphene oxide (GO) is reduced by Joule heating using in-situ transmission electron microscopy (TEM). The approach allows the simultaneous study of GO conductivity by electrical measurements and of its composition and structural properties throughout the reduction process by TEM, electron diffraction and electron energy-loss spectroscopy. The small changes of GO properties observed at low applied electric currents are attributed to the promotion of diffusion processes. The actual reduction process starts from an applied power density of about 2 x 10(14) Wm(-3) and occurs in a highly uniform and localized manner. The conductivity increases more than 4 orders of magnitude reaching a value of 3 x 10(3) Sm-1 with a final O content of less than 1%. We discuss differences between the reduction by thermal annealing and Joule heating.