Advanced, Kerr-microscopy-based MOKE magnetometry for the anisotropy characterisation of magnetic films
Advanced, Kerr-microscopy-based MOKE magnetometry for the anisotropy characterisation of magnetic films
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DOI：
10.1016/j.jmmm.2021.167889
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发表时间：
2021-03-16
影响因子：
2.7
通讯作者：
Schafer, R.
中科院分区：
文献类型：
--
作者：
Soldatov, I., V;Zehner, J.;Schafer, R.
介绍了一种先进的宽场克尔显微镜和磁测量方法，用于研究磁性薄膜的磁各向异性。我们已经解析地分析了在宽场磁光克尔显微镜的纵向克尔对比度，特别是其依赖于光的偏振方向和入射平面，并验证了它的实验。虽然通常纵向克尔效应的灵敏度方向（即反平行畴的最大对比度方向）是沿着p偏振光和s偏振光的入射平面，但我们发现灵敏度方向偏离p偏振光的入射平面。基于多分量克尔成像技术，我们已经开发出一种完全自动化的程序，用于测量磁化反转回线沿着任意面内磁场方向的磁性薄膜与面内各向异性，不需要任何机械调整的系统或样品位移。该方法被应用于溅射铁薄膜的磁各向异性的研究。此外，引入了样品保持器，其允许由于衬底弯曲而将机械应力施加到磁性膜上，并且其对各向异性方向的应力操纵的适用性被证明用于镍-铁膜。
An advanced wide-field Kerr microscopy and magnetometry approach for the investigation of magnetic anisotropy in magnetic films is demonstrated. We have analytically analysed the longitudinal Kerr contrast in a wide-field magneto-optical Kerr microscope, specifically its dependence on the light polarisation direction and the plane of incidence and verified it experimentally. While normally the sensitivity direction (i.e. the direction of maximum contrast for antiparallel domains) of the longitudinal Kerr effect is along the plane of incidence for both, p - and s-polarized light, we found a deviation of the sensitivity direction from the incidence plane for p-polarised light. Based on a multi-component Kerr imaging technique we have developed a fully automated procedure for the measurement of magnetisation reversal loops along arbitrary in-plane field directions for magnetic films with in-plane anisotropy that does not require any mechanical adjustment of the system or sample displacement. The method is applied to the investigation of the magnetic anisotropy of a sputtered iron thin film. Additionally, a sample holder was introduced, which allows for the application of mechanical stress onto magnetic films due to substrate bending, and its applicability to the stress manipulation of the anisotropy direction was demonstrated for a nickel-iron film.