In situ imaging of electromigration-induced nanogap formation by transmission electron microscopy
In situ imaging of electromigration-induced nanogap formation by transmission electron microscopy
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DOI：
10.1063/1.2767149
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发表时间：
2007-08-13
影响因子：
4
通讯作者：
van der Zant, H. S. J.
中科院分区：
文献类型：
--
作者：
Heersche, Hubert B.;Lientschnig, Guenther;van der Zant, H. S. J.
作者们通过透射电子显微镜原位成像了电迁移诱导的纳米间隙形成。实时视频记录显示，在阴极侧附近形成了边缘空洞。多晶金线逐渐变窄，直到一个单晶粒边界与收缩处相交，断裂沿此继续。在断裂的最后50毫秒期间，收缩处的几何形状发生了相对较大的变形。当在施加偏压的情况下线断裂时，阳极（钝的）和阴极（尖的）的形状是不对称的，但当一个狭窄的收缩处自发断裂时是对称的。（C）2007美国物理学会
The authors imaged electromigration-induced nanogap formation in situ by transmission electron microscopy. Real-time video recordings show that edge voids form near the cathode side. The polycrystalline gold wires narrow down until a single-grain boundary intersects the constriction along which the breaking continues. During the last 50 ms of the break, a relatively large deformation of the constriction's geometry occurs. The shape of the anode (blunt) and the cathode (sharp) is asymmetric when the wire breaks with a bias voltage applied, but symmetric when a narrow constriction breaks spontaneously. (C) 2007 American Institute of Physics.