Characterization by X-ray Diffraction of Non c-axis Epitaxial Bi2Sr2CaCu2O8+ Thin Films
Characterization by X-ray Diffraction of Non c-axis Epitaxial Bi2Sr2CaCu2O8+ Thin Films
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非 c 轴外延 Bi2Sr2CaCu2O8 薄膜的 X 射线衍射表征
DOI：
10.1109/tasc.2016.2529005
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发表时间：
2016
期刊：
影响因子：
--
通讯作者：
Y. Tateno and P. Badica
中科院分区：
文献类型：
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作者：
K. Endo;S. Arisawa;T. Kaneko;I. Tsuyumoto;Y. Tateno and P. Badica
用MOCVD方法在(110)LaAlO_3单晶衬底上生长了非c轴(117)择优取向的Bi2Sr2CaCu2O8(Bi2212)薄膜。X射线衍射仪θ-2θ扫描表明，薄膜中还含有(119)和(011)Bi2212杂质颗粒。提出并报道了用X射线衍射仪、φ-ψ扫描仪对非c轴膜进行表征的方法。用这种方法对(117)Bi-2212晶体的理论薄膜-衬底关系进行了实验验证。实验结果还证实了(117)Bi2212晶面上存在孪晶。根据薄膜-衬底关系和AFM图像，杂质(119)和(011)Bi-2212颗粒也呈屋顶状和面内排列，因此可以认为薄膜是面内外延。
Thin films of Bi2Sr2CaCu2O8(Bi-2212) with the non-c-axis (117) orientation were grown by MOCVD on (110) LaAlO3single crystal substrate. XRD θ - 2θ scans show that films contain also (119) and (011)Bi-2212 impurity grains. We propose and report characterization of the non-c-axis films by XRD φ - ψ scans. By this approach, the assumed theoretical film-substrate relationship of the (117) Bi-2212 grains is demonstrated experimentally. The result also confirms twinning in the span rooflike (117) Bi-2212 grains. The impurity (119) and (011) Bi-2212 grains are also rooflike and in-plane aligned according to film-substrate relation and AFM images so that the film can be considered in-plane epitaxial.