Suppression of electron leakage by inserting a thin undoped InGaN layer prior to electron blocking layer in InGaN-based blue-violet laser diodes.
Suppression of electron leakage by inserting a thin undoped InGaN layer prior to electron blocking layer in InGaN-based blue-violet laser diodes.
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DOI：
10.1364/oe.22.011392
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发表时间：
2014-05
期刊：
影响因子：
3.8
通讯作者：
L. Le;D. Zhao;D. Jiang;P. Chen;Z. Liu;J. Yang;X. He;X. Li;J. P. Liu;J. Zhu;S. Zhang;H. Yang
中科院分区：
文献类型：
--
作者：
L. Le;D. Zhao;D. Jiang;P. Chen;Z. Liu;J. Yang;X. He;X. Li;J. P. Liu;J. Zhu;S. Zhang;H. Yang
InGaN-based blue-violet laser diodes (LDs) suffer from electron leakage into the p-type regions, which could be only partially alleviated by employing the electron blocking layer (EBL). Here, a thin undoped InGaN interlayer prior to EBL is proposed to create an additional forbidden energy range above the natural conduction band edge, which further suppresses the electron leakage and thus improve the characteristics of LDs. Numerical device simulations reveal that when the proper composition and thickness of InGaN interlayer are chosen, the electron leakage could be efficiently eliminated without inducing any severe accumulation of electrons at the interlayer, resulting in a maximum output power of the device.
