A Surface-Silylated Single-Layer Resist Using Chemical Amplification for Deep UV Lithography : IIIa. Preliminary Results of Optimization of PAG and Its Content

A Surface-Silylated Single-Layer Resist Using Chemical Amplification for Deep UV Lithography : IIIa. Preliminary Results of Optimization of PAG and Its Content
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使用化学放大进行深紫外光刻的表面硅烷化单层抗蚀剂:IIIa。

DOI:
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发表时间:
2004
期刊:
Advances in Imaging Materials and Processes
影响因子:
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通讯作者:
Kazuyuki Sugita
Kazuyuki Sugita
中科院分区:
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文献类型:
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作者:
Kazuyuki Sugita

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