NEW POLARIZED-LIGHT MICROSCOPE WITH PRECISION UNIVERSAL COMPENSATOR

NEW POLARIZED-LIGHT MICROSCOPE WITH PRECISION UNIVERSAL COMPENSATOR
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DOI:
10.1111/j.1365-2818.1995.tb03669.x
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发表时间:
1995-11-01
期刊:
JOURNAL OF MICROSCOPY-OXFORD
影响因子:
--
通讯作者:
MEI, G
MEI, G
中科院分区:
其他
文献类型:
--
作者:
OLDENBOURG, R;MEI, G

文献摘要

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本文介绍了一种用于双折射精细结构快速、取向无关测量的新型偏光显微镜。新型偏光镜的设计采用了由两个液晶可变延迟器组成的精密通用补偿器。一个摄像机和数字图像处理系统提供快速测量样品各向异性(延迟幅度和方位角)在所有点的图像形成的视野。这些图像记录了样品薄光学切片内的精细结构和分子组织。1 nm的样品延迟,测量数据收集在0。43 s在所有640 × 480的图像点,双折射测量的例子在生物(微管阵列)和工业(磁光盘基板)标本。
A new type of polarized light microscope ('new pol-scope') for fast and orientation-independent measurement of birefringent fine structure has been developed. The design of the new pol-scope incorporates a precision universal compensator made from two liquid crystal variable retarders. A video camera and digital image processing system provide fast measurements of specimen anisotropy (retardance magnitude and azimuth) at all points of the image forming the field of view. The images document fine structural and molecular organization within a thin optical section of the specimen, The sensitivity of the current instrument is 0 . 1 nm of specimen retardance, measured with data gathered in 0 . 43 s at all 640 x 480 image points, Examples of birefringence measurements in biological (microtubule arrays) and industrial (magneto-optical disc substrate) specimens are presented.