Compaction of ATPG-generated test sequences for sequential circuits
Compaction of ATPG-generated test sequences for sequential circuits
复制标题
压缩 ATPG 生成的时序电路测试序列
DOI：
10.1109/iccad.1988.122533
复制
发表时间：
1988
期刊：
影响因子：
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通讯作者：
R. Saleh
中科院分区：
文献类型：
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作者：
R. Roy;T.M. Niermann;J. Patel;J. Abraham;R. Saleh
当前可用的自动测试模式发电机（ATPG）生成长度不佳的测试集。作者描述了新型的启发式技术，可通过压实自动生成的模式来减少顺序电路的测试集长度。基于这些技术，在C中编写了一个程序，该程序的测试长度降低了56％-73％的测试长度。<< ETX >>
Currently available automatic test pattern generators (ATPGs) generate test sets that are nonoptimal in length. The authors describe novel heuristic techniques to reduce the length of the test set for a sequential circuit by compaction of the automatically generated patterns. Based on these techniques, a program has been written in C that achieved a 56%-73% reduction in the test length of a highly sequential circuit obtained from industry.<<ETX>>