Flux Trapping in Superconducting Circuits
Flux Trapping in Superconducting Circuits
复制标题
超导电路中的磁通捕获
DOI：
10.1109/tasc.2007.898707
复制
发表时间：
2007
影响因子：
1.8
通讯作者：
V. Semenov
中科院分区：
文献类型：
--
作者：
Y. Polyakov;S. Narayana;V. Semenov
人们普遍认为，磁通俘获是一个最严重的问题，可能会产生一个超导集成电路的集成限制。我们的项目的最终目标是减少问题的SFQ电路设计的常规技术建议。为了实现这一目标，我们回顾了已知的理论和建议，减少通量捕获。该项目的另一个重要部分是对我们的建议进行实验验证。在本文中，我们描述了我们的实验技术，它允许在真实的环境中进行测量，例如，在一个封闭的循环制冷机或运输杜瓦。为了说明我们的技术的优势，我们详细讨论了一个测试电路：16位移位寄存器的测量通量捕获性能。我们发现，明显相似的细胞的通量捕获特性从细胞到细胞变化很大。换句话说，微观制造缺陷的影响可能与布局优化一样重要。
It is widely accepted that flux trapping is one of the most serious problems that could create an integration limit for superconductor integrated circuits. The ultimate goal of our project is to reduce the problem to a set of routine technical recommendations for SFQ circuit design. To achieve the goal, we review known theories and recommendations for the reduction of flux trapping. Another important part of the project is an experimental verification of our suggestions. In this paper, we describe our experimental technique, which allows measurements to be carried out in real environments, for example, in a closed-cycle refrigerator or transport Dewar. To illustrate the advantages of our technique we discuss in detail the measured flux trapping properties of one test circuit: a 16-bit shift register. We found that the flux trapping properties of apparently similar cells vary dramatically from cell to cell. In other words, the effects of microscopic fabrication imperfections could be as important as layout optimization.