Emulation of Circuits under Test Using Low-Cost Embedded Platforms
Emulation of Circuits under Test Using Low-Cost Embedded Platforms
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DOI:
10.3390/electronics10161990
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发表时间:
2021-08-01
期刊:
影响因子:
2.9
通讯作者:
Lenero-Bardallo,Juan A.
中科院分区:
文献类型:
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作者:
Guerrero-Rodriguez,Jose-Maria;Cobos Sanchez,Clemente;Lenero-Bardallo,Juan A.