Identification of failing tests with cycling registers
Identification of failing tests with cycling registers
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使用循环寄存器识别失败测试
DOI：
10.1109/test.1988.207818
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发表时间：
1988
期刊：
影响因子：
--
通讯作者：
W. McAnney
中科院分区：
文献类型：
--
作者：
J. Savir;W. McAnney
提出了一种对来自循环寄存器的签名进行操作的方法，使得识别多个失败测试的复杂度与识别单个失败测试的复杂度相当。该方法具有一些有趣的混叠特性。作者展示了混叠的概率，并建议如何保持相对较小的概率。该方法的效率随着失败测试数量的增加而降低。效率降低是由于占用空间在循环寄存器中丢失而导致混叠概率增加。失败测试的数量越多，出现混淆的可能性就越大。<<ETX>>
A method is presented of operating on signatures from a cycling register such that the complexity of identifying multiple failing tests is comparable to that of identifying a single failing test. The method has some interesting aliasing characteristics. The authors show the probability of aliasing and suggest how it can be kept relatively small. The efficiency of the method decreases as the number of failing tests increase. The reduction in efficiency is due to an increase in aliasing probability caused by footprints being lost in the cycling registers. The larger the number of failing tests, the greater is the chance that aliasing will occur.<<ETX>>