Sequential Optimization Method for the Design of Electromagnetic Device
Sequential Optimization Method for the Design of Electromagnetic Device
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DOI：
10.1109/tmag.2008.2002779
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发表时间：
2008-12
影响因子：
2.1
通讯作者：
G. Lei;K. Shao;Youguang Guo;Jianguo Zhu;J. Lavers
中科院分区：
文献类型：
--
作者：
G. Lei;K. Shao;Youguang Guo;Jianguo Zhu;J. Lavers
提出了三种用于电磁装置优化设计的序贯优化方法，即序贯最小二乘法、序贯克立格法和序贯线性贝叶斯方法。序贯优化方法(SOM)由粗优化过程和细优化过程组成。前者的主要目的是缩小设计空间，后者的目标是更新最优设计参数。为了说明所提出的方法的性能，对一个分析测试函数和团队研讨会问题22进行了研究。测试函数的实验结果表明，SOM可以得到满意的解；实际应用表明，与直接优化法相比，有限元样本点数减少不到1/10，而优化结果甚至优于直接优化法。
Three sequential optimization methods, sequential least square method, sequential Kriging method, and sequential linear Bayesian method, are presented for the optimization design of electromagnetic device. Sequential optimization method (SOM) is composed of coarse optimization process and fine optimization process. The main purpose of the former is to reduce the design space; while the target of the latter is to update the optimal design parameters. To illustrate the performance of the proposed methods, an analytic test function and the TEAM Workshop Problem 22 are investigated. Experimental results of test function demonstrate that SOM can obtain satisfactory solutions; and practical application illustrates that the number of finite element sample points is less than 1/10 compared with that by direct optimization method, while the optimal results are even better than that by direct optimization method.