On the identification of defects in a periodic waveguide from far field data
On the identification of defects in a periodic waveguide from far field data
复制标题
利用远场数据识别周期性波导中的缺陷
DOI:
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发表时间:
2014
期刊:
影响因子:
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通讯作者:
S. Fliss
中科院分区:
文献类型:
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作者:
L. Bourgeois;S. Fliss
The aim of this paper is to apply the linear sampling method and the factorization method to retrieve some defects in a known periodic 2D waveguide from scattering data. More precisely, some far field approximations of these two sampling methods are derived. They amount to considering the so-called propagating Floquet modes as incident waves. The efficiency of the far field formulation of the linear sampling method is shown with the help of some numerical experiments.