First laboratory X‐ray diffraction contrast tomography for grain mapping of polycrystals
First laboratory X‐ray diffraction contrast tomography for grain mapping of polycrystals
复制标题
首个用于多晶晶粒绘图的实验室 X 射线衍射对比断层扫描
DOI：
10.1107/s0021889813022553
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发表时间：
2013
影响因子：
6.1
通讯作者：
W. Ludwig
中科院分区：
文献类型：
--
作者：
A. King;P. Reischig;J. Adrien;W. Ludwig
本文首次介绍了采用微焦W靶x射线管源的实验室层析成像仪在90 kV、350 μ a条件下进行三维粮食测绘的结果。适应算法利用多色辐射光谱和投影放大产生的锥形光束几何。本文首次绘制了含42粒钛样品的晶粒形状和晶体取向图，并通过晶界的相衬重建证实了其有效性。展望了该技术的进一步发展，以适应具有更多晶粒或更大的粒内取向扩散的样品。
The first results of three-dimensional grain mapping using a laboratory tomograph equipped with a microfocus W target X-ray tube source, operated at 90 kV and 350 mu A, are presented. Adapted algorithms exploit the polychromatic radiation spectrum and the projection magnification arising from the cone-beam geometry. The first map of grain shapes and crystallographic orientations from a titanium sample containing 42 grains is presented and its validity confirmed by a phase contrast reconstruction of the grain boundaries. Perspectives are given for the further development of the technique to accommodate samples with more grains or with greater intragranular orientation spread.