Fine nanostructure analysis of single-wall carbon nanohorns by surface-enhanced Raman scattering
Fine nanostructure analysis of single-wall carbon nanohorns by surface-enhanced Raman scattering
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DOI：
10.1021/jp801416b
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发表时间：
2008-05-22
影响因子：
3.7
通讯作者：
Kaneko, Katsumi
中科院分区：
文献类型：
--
作者：
Fujimori, Toshihiko;Urita, Koki;Kaneko, Katsumi
采用表面增强拉曼散射（SERS）技术研究了单壁碳纳米角（swcnh）和部分氧化碳纳米角（swcnh以拉曼D带为主）的精细纳米结构。将SWCNH颗粒沉积在银箔上，蒸发SWCNH分散溶剂，在真空条件下测量SWCNH样品的SERS。在200 ~ 1700 cm（-1）的波数范围内，除了在正常拉曼散射中观察到的峰外，还观察到新的峰。由于五边形和七边形等拓扑缺陷，新的SERS峰暂时被分配到振动模式。
Surface-enhanced Raman scattering (SERS) was applied to investigate the fine nanostructure of single-wall carbon nanohorns (SWCNHs) and partially oxidized SWCNHs of which Raman D bands are predominant. SERS of SWCNH samples was measured in vacuo by deposition of SWCNH particles on silver foil with evaporation of SWCNHs-dispersed solvent. New peaks were observed over the wavenumber range of 200 to 1700 cm(-1) in addition to peaks observed in normal Raman scattering. The new SERS peaks are tentatively assigned to the vibrational mode due to topological defects such as the pentagon and heptagon.