Atomic switch: Development of resistive switching memories based on nanoscale migration of cations in oxide thin films
Atomic switch: Development of resistive switching memories based on nanoscale migration of cations in oxide thin films
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原子开关:基于氧化物薄膜中阳离子纳米级迁移的阻变存储器的开发
DOI:
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发表时间:
2011
期刊:
影响因子:
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通讯作者:
and M. Aono
中科院分区:
文献类型:
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作者:
T. Tsuruoka;T. Hasegawa;K. Terabe;and M. Aono