Scanning Nonlinear Dielectric Microscope with Submicron Resolution.

Scanning Nonlinear Dielectric Microscope with Submicron Resolution.
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具有亚微米分辨率的扫描非线性介电显微镜。

DOI：
10.1143/jjap.37.3132
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发表时间：
1998
期刊：
影响因子：
--
通讯作者：
J. Kushibiki
J. Kushibiki
中科院分区：
--
文献类型：
--
作者：
Yasuo Cho;K. Matsuura;J. Kushibiki

文献摘要

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研制了一种用于扫描非线性介电显微镜的新型钨针探头。这个探头的分辨率是亚微米。该探头与亚微米工作台相结合，用来观察具有质子交换反型层的钽酸锂衬底以及极化和去极化的锆钛酸铅陶瓷中的磁畴分布。
A new probe using a tungsten needle for the scanning nonlinear dielectric microscope has been developed. This probe has a submicron resolution. This probe combined with a submicron stage is used to observe the distribution of domains in a lithium tantalate substrate with a proton exchanged inversion layer and also in polarized and depolarized lead zirconate titanate ceramics.