Systematic errors in direct state measurements with quantum controlled measurements
Systematic errors in direct state measurements with quantum controlled measurements
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DOI：
10.1088/1361-6455/ab7881
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发表时间：
2020-02
期刊：
影响因子：
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通讯作者：
Le Bin Ho
中科院分区：
文献类型：
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作者：
Le Bin Ho
冯·诺依曼测量框架描述了目标系统和探针之间的动态相互作用。相比之下，量子控制测量框架使用量子位探针来控制不同算子在目标系统上的作用，便于建立通用量子计算。在这项工作中，我们使用一个量子控制的测量框架来直接测量量子态。我们介绍了两种类型的量子控制测量框架，并研究了这两种类型引起的系统误差（真实值与估计值之间的偏差）。我们在数值上研究了系统误差，评估了置信区域，并研究了由于检测不完善而产生的实验噪声的影响。我们的分析在直接量子态层析中有重要的应用。
The von Neumann measurement framework describes a dynamic interaction between a target system and a probe. In contrast, a quantum controlled measurement framework uses a qubit probe to control the actions of different operators on the target system, and is convenient for establishing universal quantum computation. In this work, we use a quantum controlled measurement framework for measuring quantum states directly. We introduce two types of the quantum controlled measurement framework and investigate the systematic error (the bias between the true value and the estimated values) that are caused by these types. We numerically investigate the systematic errors, evaluate the confidence region, and investigate the effect of experimental noise that arises from the imperfect detection. Our analysis has important applications in direct quantum state tomography.