Structural parameter determination in fluorescence EXAFS of concentrated samples
Structural parameter determination in fluorescence EXAFS of concentrated samples
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DOI：
10.1063/1.1140311
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发表时间：
1989-06
影响因子：
1.6
通讯作者：
Z. Tan;J. Budnick;S. Heald
中科院分区：
文献类型：
--
作者：
Z. Tan;J. Budnick;S. Heald
荧光检测通常用于获得稀释样品和薄膜的扩展X射线吸收精细结构（EXAFS）。随着样品的浓缩和薄膜的变厚，EXAFS的振幅会产生很大的误差。通过详细的计算，我们确定了配位数（N）的减少和荧光检测确定的均方相对位移（σ2）的偏差。对Cu、Ni、Fe和Nb样品的实验结果支持了计算结果。当其他方法不可行时，我们建议校正以获得正确的配位数和σ2值，用于荧光EXAFS检测浓缩样品的研究。
Fluorescence detection is often used to obtain the extended x‐ray absorption fine structure (EXAFS) of dilute samples and thin films. As the samples become concentrated and the films become thick, significant errors can be introduced in the EXAFS amplitudes. With detailed calculations we determine the reduction in the coordination numbers (N) and the deviation in the mean‐squared relative displacements (σ2) as determined by fluorescence detection. Experimental results on Cu, Ni, Fe, and Nb samples support the predictions of the calculation. We suggest corrections to obtain the correct coordination numbers and σ2 values for studies of concentrated samples by fluorescence EXAFS detection when other methods are not feasible.