Fabrication and characterization of high-resolution AFM tips with high-quality double-wall carbon nanotubes
Fabrication and characterization of high-resolution AFM tips with high-quality double-wall carbon nanotubes
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DOI：
10.1016/j.cplett.2006.08.045
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发表时间：
2006-10-05
影响因子：
2.8
通讯作者：
Shinohara, Hisanori
中科院分区：
文献类型：
--
作者：
Kuwahara, Shota;Akita, Seiji;Shinohara, Hisanori
双壁碳纳米管（DWNTs）已被成功地用作AFM针尖。已经发现DWNT尖端在高分辨率和高纵横比成像的独特组合以及尖端的较长寿命方面具有超过多壁CNT和单壁CNT尖端的巨大优势。通过高温放电方法制备的高质量DWNTs在SEM观察期间通过操纵附着到AFM针尖。通过与传统探头和DWNT探头的比较表明，DWNT探头对单壁碳纳米管等纳米材料具有较高的横向分辨率。(c)2006 Elsevier B.V.保留所有权利。
Double-wall carbon nanotubes (DWNTs) have been successfully used as AFM tips. DWNT tips have been found to possess great advantages over multi-wall CNT- and single-wall CNT-tips in terms of a unique combination of high resolution and high aspect ratio imaging together with a longer lifetime of the tip. The high quality DWNTs prepared by the high-temperature discharge method is attached to the AFM tip by manipulation during SEM observation. The comparison with DWNT tips and other conventional tips shows that the DWNT tip manufactured in the present study has the high lateral resolution on nanomaterials such as single-wall carbon nanotubes. (c) 2006 Elsevier B.V. All rights reserved.