An X-ray diffraction investigation of liquid indium
An X-ray diffraction investigation of liquid indium
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液态铟的 X 射线衍射研究
DOI：
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发表时间：
1966
期刊：
影响因子：
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通讯作者：
Susan P. Smith
中科院分区：
文献类型：
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作者：
B. Orton;Susan P. Smith
本文对液铟在160℃和498℃的强度图样进行了新的测量。以前的工作表明，在主峰的高角一侧可能存在一个次要的极大值，但没有找到这样的极大值。无论是强度谱(SINθ)/λ−0·182A−1)还是径向分布函数(r=3·3A)的第一峰位置都没有随温度变化，唯一影响强度谱随温度升高的是谱变宽。介绍了一种测量强度图案形状变化的方法。
Abstract New measurements have been made of the intensity patterns of liquid indium at 160°c and 498°c. Previous work indicated that a subsidiary maximum might be found on the high angle side of the main peak; no such maximum was found. No change with temperature was found for the first peak position of either the intensity pattern, (sin θ)/λ − 0·182 A−1, or the radial distribution function, r=3·3 A. The only effect on the intensity pattern of increasing the temperature was that the pattern became broader. A method of measuring changes in shape of intensity patterns was introduced.