Low energy Fe+ beam irradiation to C60 thin film.
Low energy Fe+ beam irradiation to C60 thin film.
复制标题
低能Fe束照射C60薄膜。
DOI：
10.1063/1.3675456
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发表时间：
2012
期刊：
影响因子：
--
通讯作者：
Yoshikazu Yoshida
中科院分区：
文献类型：
--
作者：
H. Minezaki;K. Oshima;Takashi Uchida;M. Muramatsu;T. Asaji;Atsushi Kitagawa;Y. Kato;S. Biri;Yoshikazu Yoshida
我们研制了一台电子回旋共振离子源装置，它是专为生产内嵌富勒烯而设计的。在本研究中，我们用Fe（+）离子束照射C（60）薄膜。我们改变了剂量和离子能量的实验条件。通过飞行时间质谱分析，我们可以观察到Fe + C（60）峰。Fe + C（60）峰的最高强度在离子能量为200 eV时观察到。Fe + C（60）峰强度随辐照时间的延长和剂量的增大而增大。
We have developed an electron cyclotron resonance ion source apparatus, which is designed for the production of endohedral fullerene. In this study, we irradiated the Fe(+) beam to the C(60) thin film. We changed the experimental condition of the dose and the ion energy. We could observe the Fe + C(60) peak by analysis of the time-of-flight mass spectrometry. The highest intensity of the Fe + C(60) peak was observed at the ion energy of 200 eV. The Fe + C(60) peak intensity tended to become high in the case of long irradiation time and large dose.