EMC3-EIRENE modelling of edge impurity transport in the stochastic layer of the large helical device compared with extreme ultraviolet emission measurements

EMC3-EIRENE modelling of edge impurity transport in the stochastic layer of the large helical device compared with extreme ultraviolet emission measurements
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大型螺旋装置随机层中边缘杂质传输的 EMC3-EIRENE 建模与极紫外发射测量的比较

DOI:
10.1088/0029-5515/56/6/066005
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发表时间:
2016-05
期刊:
影响因子:
3.3
通讯作者:
Shu Yu Dai
Shu Yu Dai
中科院分区:
物理与天体物理1区
文献类型:
--
作者:
Shu Yu Dai

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用三维边缘输运程序EMC3-Eirene研究了大型螺旋器件随机层中碳杂质的输运特性和线发射。通过参数研究考察了模拟结果对杂质输运模型中各输运项和杂质源特征(即源的数量和位置)的敏感性。模拟表明,为了再现发射分布的实验结果,杂质垂直输运系数(DIMP)和第一壁源起着重要作用,而离子热和摩擦力的变化并不重要。对边缘随机层中的通量管轨迹和磁场结构与杂质输运的详细研究表明,由于DIMP和第一壁源的增强,杂质更深地穿透到较高的等离子体密度区,从而导致发射图案和强度的变化。分析表明,DIMP可能比背景等离子体大几个因素,并且可能存在大量的第一壁杂质源。
The transport properties and line emissions of carbon impurity in the stochastic layer of the Large Helical Device have been investigated with the 3D edge transport code EMC3-EIRENE. A parameter study has been performed to examine the sensitivity of the simulation results on each transport term in the impurity transport model and the impurity source characteristics, i.e. the source amount and the location. The modelling has revealed that in order to reproduce the experimental results of the emission distribution, the impurity perpendicular transport coefficient (Dimp) and the first wall source play important roles, while changes to the ion thermal and the friction forces are rather irrelevant. The detailed study of flux tube tracing and magnetic field structure in the edge stochastic layer, in relation to impurity transport, has shown that the deeper penetration of impurity into the higher plasma density region due to the enhanced Dimp and the first wall source is responsible for the change of emission pattern as well as the intensity. The analysis indicates that Dimp might be larger than that of background plasma by a few factors and also that there probably exists a substantial amount of first wall impurity source.
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