A Low-Noise High Intrascene Dynamic Range CMOS Image Sensor With a 13 to 19b Variable-Resolution Column-Parallel Folding-Integration/Cyclic ADC
A Low-Noise High Intrascene Dynamic Range CMOS Image Sensor With a 13 to 19b Variable-Resolution Column-Parallel Folding-Integration/Cyclic ADC
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DOI：
10.1109/jssc.2011.2164298
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发表时间：
2012-01-01
影响因子：
5.4
通讯作者：
Kawahito, Shoji
中科院分区：
文献类型：
--
作者：
Seo, Min-Woong;Suh, Sung-Ho;Kawahito, Shoji
研制了一种低时间噪声、高动态范围的CMOS图像传感器。采用列并行折叠积分和循环ADC的100万像素CMOS图像传感器在折叠积分ADC模式下使用64次采样时具有80 μ V-rms（1.2e（-））的时间噪声和82 dB的动态范围。通过改变象素输出的取样数，可获得13 b至19 b的非常高的可变灰度分辨率。所实现的CMOS图像传感器使用0.18 μ m的技术具有10-V/lx的灵敏度。s，转换增益为67 μ V/e（-），线性数字编码范围大于40倍。
A low temporal noise and high dynamic range CMOS image sensor is developed. A 1Mpixel CMOS image sensor with column-parallel folding-integration and cyclic ADCs has 80 mu V-rms (1.2e(-)) temporal noise, 82 dB dynamic range using 64 samplings in the folding-integration ADC mode. Very high variable gray-scale resolution of 13b through 19b is attained by changing the number of samplings of pixel outputs. The implemented CMOS image sensor using a 0.18-mu m technology has the sensitivity of 10-V/lx . s, the conversion gain of 67-mu V/e(-), and linear digital code range of more than 4 decades.