Monitoring electron-beam irradiation effects on graphenes by temporal Auger electron spectroscopy
Monitoring electron-beam irradiation effects on graphenes by temporal Auger electron spectroscopy
复制标题
通过时间俄歇电子能谱监测电子束辐照对石墨烯的影响
DOI：
10.1088/0957-4484/21/26/265705
复制
发表时间：
2010-07-02
期刊：
影响因子：
3.5
通讯作者：
Hanagata, Nobutaka
中科院分区：
文献类型：
--
作者：
Xu, Mingsheng;Fujita, Daisuke;Hanagata, Nobutaka
由于其独特的电子输运性质，石墨烯近年来引起了人们极大的兴趣。利用俄歇电子能谱和拉曼光谱研究了电子束辐照对石墨烯的损伤效应。我们已经证明，用电子束照射可以选择性地去除石墨烯层并诱导化学反应，以及可能的结构转变。我们还证明了电子束剂量对石墨烯损伤的依赖性。我们的工作为如何优化石墨烯表征和器件制造的实验条件提供了思路。结果揭示了从电子束到石墨烯层的能量转移如何导致从石墨烯层中去除碳原子，以及使用电子束照射以受控方式局部诱导化学反应的可能性。
Because of its unique electronic transport properties, graphene has attracted an enormous amount of interest recently. By using standard Auger electron spectroscopy and Raman spectroscopy, we have studied electron-beam irradiation effects on graphene damage. We have shown that irradiation with an electron-beam can selectively remove graphene layers and induce chemical reactions, as well as possible structural transformations. We have also demonstrated the dependence of damage in graphene on electron-beam dose. Our work provides ideas on how to optimize the experimental conditions for graphene characterization and device fabrication. The results throw light on how energy transfer from the electron beam to graphene layers leads to the removal of carbon atoms from graphene layers and on the possibility of using electron-beam irradiation to locally induce chemical reactions in a controlled manner.