Electrostatic micromanipulation of a conductive/dielectric particle by a single probe
Electrostatic micromanipulation of a conductive/dielectric particle by a single probe
复制标题
DOI：
10.1109/nano.2007.4601292
复制
发表时间：
2007-08
期刊：
影响因子：
--
通讯作者：
S. Saito;Masaki Sonoda;Toshihiro Ochiai;M. Han;Kunio Takahashi
中科院分区：
文献类型：
--
作者：
S. Saito;Masaki Sonoda;Toshihiro Ochiai;M. Han;Kunio Takahashi
本研究报告的可能性，静电微操作的导电/介电粒子使用一个单一的探针。该操纵系统由三个物体组成：作为操纵工具的导电探针、作为基底的导电板和作为微粒子的导电/介电粒子。对于导电粒子，开发了一种通过施加具有高开关速率的加速和减速电压的微操作技术。我们通过边界元法从理论上确定了作为时间函数的所需电压，并通过实验验证了该电压对直径30微米的焊料颗粒有效地起作用。对于介电颗粒，我们实验证明了成功的拿起一个60微米直径的介电颗粒（苯酚，聚苯乙烯）从基板上的静电力。此外，特别是对于聚苯乙烯颗粒，我们观察到的现象，一个微小的颗粒来回之间的基板和探针尖端像一个微滴，即使只是施加恒定的电压。我们讨论了这一有趣现象的可能机制和电介质微粒静电操纵的可行性。
This study reports the possibility of electrostatic micromanipulation of a conductive/dielectric particle using a single probe. The manipulation system consists of three objects: a conductive probe as a manipulating tool, a conductive plate as a substrate, and a conductive/dielectric particle that dubs as a micro-particle. For a conductive particle, a micromanipulation technique by applying accelerating and decelerating voltage with high switching rate is developed. We theoretically determine the desired voltage as the function of time by boundary element method, and experimentally verify the voltage effectively works with a 30-micrometer-in-diameter solder particle. For a dielectric particle, we experimentally demonstrate the successful picking-up of a 60-micrometer-in-diameter dielectric particle (phenol, polystyrene) from the substrate by electrostatic force. Besides, especially for a polystyrene particle, we observe the phenomenon of a micro-particle going back and forth between the substrate and the probe-tip like a micro-dribble even when just the constant voltage is applied. We discuss the possible mechanism of this interesting phenomenon and the feasibility of electrostatic manipulation for a dielectric micro-particle.