Oxide Semiconductor Plasmonics for Infrared Applications
Oxide Semiconductor Plasmonics for Infrared Applications
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DOI:
10.1007/978-3-030-74073-3_4
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发表时间:
2021
期刊:
影响因子:
--
通讯作者:
H. Matsui
中科院分区:
文献类型:
--
作者:
H. Matsui
This chapter describes plasmonic responses in In2O3: Sn nanoparticles (ITO NPs) and their assembled NP films in the infrared (IR) range. ITO NPs clearly provide resonance peaks related to local surface plasmon resonances (LSPRs) in the near-IR range, which are dependent on electron density in the NPs. In particular, electron–impurity scattering plays an important role in determining carrier-dependent plasmon damping, which is needed for the design of plasmonic materials based on ITO. The characteristics ITO NPs are mainly dominated by light absorption. However, high light reflection is observed in the near- and mid-IR range when using assembled NP films. This phenomenon is due to the fact that the introduction of surface modifications to the NPs can facilitate the production of electric field (E-field) coupling between the NPs. The three-dimensional (3D)E-field coupling allows for resonant splitting of plasmon excitations to the quadrupole and dipole modes, thereby resulting in selective high reflections in the IR range. The interparticle lengths and their derived plasmon interactions can successfully be realized via high reflective performances from the assembled NP films. This work provides important insights for harnessing IR optical responses based on plasmonic technology that can be applied to IR solar thermal shielding applications.