ESR study of impurities in strontium titanate films
ESR study of impurities in strontium titanate films
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DOI：
10.1134/1.1371362
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发表时间：
2001-05
影响因子：
0.6
通讯作者：
M. Glinchuk;I. Bykov;A. Slipenyuk;V. Laguta;L. Jastrabík
中科院分区：
文献类型：
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作者：
M. Glinchuk;I. Bykov;A. Slipenyuk;V. Laguta;L. Jastrabík
该论文报告了 UV 照射（λ=365 nm）前后 Cr 和 Ca 共掺杂 SrTiO3 薄膜（厚度为 1700 和 350 nm）的 ESR 研究。厚膜的光谱（1700 nm）呈现出两条ESR线，其g因子分别为1.977和1.974，属于Cr3+中心。在薄膜的光谱（350 nm）中，只能观察到一条线，这是由于铬中心的原因，其因子为1.974。计算表明，g因子较小的线属于靠近薄膜表面的Cr3+中心。紫外线照射后光谱中观察到的弱线（gfactor = 2.012）很可能是由于 O− 中心造成的。研究了观察中心的热稳定性区域。对块状样品和薄膜中的杂质特征进行了比较分析。
The paper reports on an ESR study of Cr-and Ca-codoped SrTiO3films, 1700 and 350 nm thick, before and after UV irradiation (λ=365 nm). The spectrum of the thick film (1700 nm) exhibits two ESR lines withgfactors of 1.977 and 1.974, which belong to the Cr3+centers. In the spectrum of the thin film (350 nm), one observes only one line, which is due to the chromium center with agfactor of 1.974. Calculations showed that the line with the smallergfactor belongs to the Cr3+center located close to the film surface. The weak line observed in the spectrum after UV irradiation (gfactor = 2.012) is most likely due to the O−center. The regions of thermal stability of the observed centers were studied. A comparative analysis of the characteristics of impurities in bulk samples and films was carried out.