Synapse classification and localization in Electron Micrographs
Synapse classification and localization in Electron Micrographs
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DOI：
10.1016/j.patrec.2013.06.001
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发表时间：
2014-07-01
影响因子：
5.1
通讯作者：
Manjunath, B. S.
中科院分区：
文献类型：
--
作者：
Jagadeesh, Vignesh;Anderson, James;Manjunath, B. S.
电子显微图像中生物结构的分类与检测是一个较新的大规模图像分析问题。主要的挑战是在建模不同的视觉特性和可扩展技术的发展。在本文中，我们提出了新的方法突触检测和定位，在连接组学的一个重要问题。我们首先提出了一个基于属性的描述符来表征突触连接。这些描述符是特定于任务的，低维的，并且可以在大图像尺寸上缩放。随后，提出了这些路口的快速定位技术。从哺乳动物视网膜组织获取的图像上的实验结果与用于对象检测的最新描述符的状态相比是有利的。(C)2013年爱思唯尔B。V.保留所有权利。
Classification and detection of biological structures in Electron Micrographs (EM) is a relatively new large scale image analysis problem. The primary challenges are in modeling diverse visual characteristics and development of scalable techniques. In this paper we propose novel methods for synapse detection and localization, an important problem in connectomics. We first propose an attribute based descriptor for characterizing synaptic junctions. These descriptors are task specific, low dimensional and can be scaled across large image sizes. Subsequently, techniques for fast localization of these junctions are proposed. Experimental results on images acquired from a mammalian retinal tissue compare favorably with state of the art descriptors used for object detection. (C) 2013 Elsevier B. V. All rights reserved.