Locally excited surface-plasmon-polaritons for thickness measurement of LBK films
Locally excited surface-plasmon-polaritons for thickness measurement of LBK films
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DOI：
10.1016/s0030-4018(98)00240-5
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发表时间：
1998-08-01
影响因子：
2.4
通讯作者：
Knoll, W
中科院分区：
文献类型：
--
作者：
Kano, H;Knoll, W
我们报道了一种利用局部激发的表面等离子体激元（SPPs）作为传感探针测量薄膜厚度的方法。为此，使用具有高数值孔径的物镜透镜来产生可以与SPP耦合的倏逝波。通过使用这种激发方法，可以获得局部激发的SPP。我们演示了沉积在银表面上的Langmuir-Blodgett-Kuhn薄膜的厚度测量。实验上，我们发现纳米级的分辨率是可以实现的。(C)1998 Elsevier Science B. V.保留所有权利。
We report on a method in which locally excited surface-plasmon-polaritons (SPPs) are utilized as a sensing probe to measure the thickness of thin films. To this end, an objective lens with a high numerical aperture is used to produce an evanescent wave which can couple with SPPs. By using this excitation method, locally excited SPPs are obtainable. We demonstrate the thickness measurement of a Langmuir-Blodgett-Kuhn film deposited onto a silver surface. Experimentally, we find that nanometer-order resolution is achievable. (C) 1998 Elsevier Science B.V. All rights reserved.