Near-field enhancement of the nanostructure on the fused silica with rigorous method

Near-field enhancement of the nanostructure on the fused silica with rigorous method
复制标题

DOI:
10.1364/ao.54.004318
复制
发表时间:
2015-05-10
期刊:
影响因子:
1.9
通讯作者:
Shao, Jianda
Shao, Jianda
中科院分区:
工程技术4区
文献类型:
--
作者:
Wang, Hu;Qi, Hongji;Shao, Jianda

文献摘要

被引文献

相似文献

提出了一种分析纳米亚表面缺陷引起的近场共振效应的严格电磁方法,它在描述透明介质材料激光-物质相互作用过程中吸收增强的过程中起着关键作用。用这种新方法计算的总电场与有限差分时域法的模拟结果基本一致。提出了模幅密谱的概念,用来分析全场的特定模式。提出了一种新的模式参数来区分共振的贡献。将频率空间划分为四个部分,分析了共振效应以及不同模式对总场的贡献。讨论了结构参数对近场调制和能量传输的影响。研究发现,近场和局域吸收的增强机制是由纳米结构侧壁的全内反射引起的共振效应。此外,通过能流分析,周围的能量主要由结构的根部引导进入结构。(C)2015年美国光学学会
A rigorous electromagnetic method is developed to analyze the resonance effect of near field caused by nanoscale subsurface defects, which play a key role in describing absorption enhancement during laser-matter interaction for transparent dielectric materials. The total electric field calculated with this new method is consistent with the result of finite-difference time-domain simulation. The concept of mode amplitude density spectrum is developed to analyze the specific modes of the total field. A new mode parameter is proposed to demarcate the contribution of the resonance. The frequency space is divided into four parts and the resonance effect is analyzed as well as the contributions of different modes to the total field. The influence of the structure parameters on the near-field modulation and energy transference is also discussed. It is found that the enhancement mechanism of the near-field and local absorption is the resonance effect caused by the total internal reflection on the sidewall of the nanostructure. In addition, the surrounding energy is mainly guided into the structure by the root of the structure via the energy flow analysis. (C) 2015 Optical Society of America