High-resolution low-dose scanning transmission electron microscopy
High-resolution low-dose scanning transmission electron microscopy
复制标题
DOI：
10.1093/jmicro/dfp052
复制
发表时间：
2010-04-01
期刊：
影响因子：
--
通讯作者：
Stahlberg, Henning
中科院分区：
文献类型：
--
作者：
Buban, James P.;Ramasse, Quentin;Stahlberg, Henning
在过去的二十年中，扫描透射电子显微镜 (STEM) 仪器不断向更高强度的电子探针发展，以提高记录图像的信噪比。虽然这适用于坚固的样本，但生物样本需要大大减少的电子剂量才能进行高分辨率成像。我们在这里描述了使用传统场发射枪 STEM 进行低剂量 STEM 图像记录的协议，同时保持仪器的高分辨率能力。我们的研究结果表明，减少像素停留时间和减少枪电流的结合可以实现与低剂量 TEM 相当的辐射剂量。
During the past two decades instrumentation in scanning transmission electron microscopy (STEM) has pushed toward higher intensity electron probes to increase the signal-to-noise ratio of recorded images. While this is suitable for robust specimens, biological specimens require a much reduced electron dose for high-resolution imaging. We describe here protocols for low-dose STEM image recording with a conventional field-emission gun STEM, while maintaining the high-resolution capability of the instrument. Our findings show that a combination of reduced pixel dwell time and reduced gun current can achieve radiation doses comparable to low-dose TEM.