PRINCIPLE AND APPLICATION OF PHASE-SHIFTING ELECTRON HOLOGRAPHY

PRINCIPLE AND APPLICATION OF PHASE-SHIFTING ELECTRON HOLOGRAPHY
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DOI:
10.1016/0304-3991(94)90171-6
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发表时间:
1994-08-01
期刊:
影响因子:
2.2
通讯作者:
TONOMURA, A
TONOMURA, A
中科院分区:
工程技术3区
文献类型:
--
作者:
RU, Q;LAI, G;TONOMURA, A

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本文介绍了一种改进的相移干涉电子全息术。它在相位测量、再现像的空间分辨率和全息图形成方面的改进通过以下三个实验得到了阐明和证明:(1)定量检测碳钇矿晶体膜上的原子表面台阶,(2)在碳钇矿衬底上外延生长的金薄片的形貌测量,和(3)细菌鞭毛细丝的灵敏观察。
Electron holography using an improved phase-shifting (fringe-scanning) interferometric technique is described. The improvements it makes in phase measurement, in spatial resolution of reconstructed images and in hologram formation are clarified and demonstrated with three experiments: (1) quantitative detection of atomic surface steps on molybdenite crystal film, (2) topographic measurement of gold platelets epitaxially grown on a molybdenite substrate, and (3) sensitive observation of a bacterial flagellum filament.