Gamma irradiation induced defects in different types of fused silica

Gamma irradiation induced defects in different types of fused silica
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DOI:
10.1016/j.jnucmat.2008.12.232
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发表时间:
2009-04-30
影响因子:
3.1
通讯作者:
Hodgson, E. R.
Hodgson, E. R.
中科院分区:
工程技术2区
文献类型:
--
作者:
Leon, M.;Martin, P.;Hodgson, E. R.

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在这项工作中,被认为是热核实验堆光学诊断和远程处理部件的主要候选材料的KU1和KS-4V二氧化硅玻璃与五种商业类型的二氧化硅一起进行了从10kGy到12mGy剂量的伽马辐照。在每次辐照后,得到了不同等级的光吸收,并比较了不同类型的二氧化硅对每个缺陷的浓度演化。这种比较使我们能够确定哪些缺陷是固有的,哪些取决于杂质水平或制造方法。这一结果使人们能够更好地了解不同二氧化硅等级中存在的前体的相关性。(C)2008爱思唯尔B.V.保留所有权利。
In this work, KU1 and KS-4V silica glasses, considered as the main candidate materials for optical diagnostic and remote handling components in ITER, have been gamma irradiated at doses from 10 kGy up to 12 MGy together with five commercial types of silica. After each irradiation the optical absorption of the different grades has been obtained, and the concentration evolution of each defect has been compared for the different silica types. This comparison allowed us to determine which defects are intrinsic and which depend on the impurity level or fabrication method. The results allow one a better understanding of the relevance of the precursors present in the different silica grades. (C) 2008 Elsevier B.V. All rights reserved.