Physical properties of very thin SnS films deposited by thermal evaporation
Physical properties of very thin SnS films deposited by thermal evaporation
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热蒸发沉积的极薄 SnS 薄膜的物理特性
DOI：
10.1016/j.tsf.2011.01.355
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发表时间：
2011-11-01
期刊：
影响因子：
2.1
通讯作者：
Conibeer, Gavin
中科院分区：
文献类型：
--
作者：
Cheng, Shuying;Conibeer, Gavin
用热蒸发法在玻璃衬底上沉积了厚度为20-65 nm的SnS薄膜。利用X射线衍射仪、扫描电子显微镜、X射线光电子能谱、拉曼光谱和紫外-可见-近红外光谱对薄膜的室温物理性能进行了研究。X射线衍射、X射线光电子能谱和拉曼光谱分析表明，沉积的薄膜主要为SnS相，但也可能含有少量Sn2S3。所沉积的SnS薄膜无针孔，表面光滑，与衬底表面的结合力强。随着薄膜厚度从20 nm增加到65 nm，SnS薄膜的颜色由淡黄色变为棕色。薄膜的表面非常光滑，因此它们的反射率很高。薄膜的直接带隙在2.15 eV到2.28 eV之间，远大于体相SnS的1.3 eV，这一点值得进一步研究。(C)2011爱思唯尔B.V.保留所有权利。
SnS films with thicknesses of 20-65 nm have been deposited on glass substrates by thermal evaporation. The physical properties of the films were investigated using X-ray diffraction (XRD), scanning electron microscopy, X-ray photoelectron spectroscopy (XPS), Raman spectroscopy, and ultraviolet-visible-near infrared spectroscopy at room temperature. The results from XRD, XPS and Raman spectroscopy analyses indicate that the deposited films mainly exhibit SnS phase, but they may contain a tiny amount of Sn2S3. The deposited SnS films are pinhole free, smooth and strongly adherent to the surfaces of the substrates. The color of the SnS films changes from pale yellow to brown with the increase of the film thickness from 20 nm to 65 nm. The very smooth surfaces of the thin films result in their high reflectance. The direct bandgap of the films is between 2.15 eV and 2.28 eV which is much larger than 1.3 eV of bulk SnS, this is deserving to be investigated further. (C) 2011 Elsevier B.V. All rights reserved.