Confocal micro-X-ray fluorescence analysis as a new tool for the non-destructive study of the elemental distributions in pharmaceutical tablets
Confocal micro-X-ray fluorescence analysis as a new tool for the non-destructive study of the elemental distributions in pharmaceutical tablets
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DOI：
10.1016/j.talanta.2011.04.027
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发表时间：
2011-07-15
期刊：
影响因子：
6.1
通讯作者：
Tchoreloff, Pierre
中科院分区：
文献类型：
--
作者：
Mazel, Vincent;Reiche, Ina;Tchoreloff, Pierre
药物片剂的化学成像研究是目前制药工业中一个重要的新兴领域。发现不同化合物在片剂中的分布对于生产质量控制和假冒检测都是一个重要的问题。目前使用的大多数技术仅限于对压片表面的研究，而对散装的研究需要耗时的样品制备。本文介绍了三维微型X射线荧光分析（3D mu XRF）用于药片无损研究的方法，通过两个不同的例子表明，可以测量从表面到表面下数百微米深度的多种无机元素（Zn、Fe、Ti、Mn、Cu）的分布。取决于基质成分和能量的X射线吸收是这种分析方法在进行深度剖析或绘图时最关键的因素之一。因此，一个原始的方法来校正的吸收，以准确地测量真实的元素分布，提出了。此外，通过使用二氧化钛在药物涂层中的存在，我们证明了这种技术也适用于涂层厚度的非破坏性测量。(C)2011爱思唯尔有限公司版权所有。
Chemical imaging studies of pharmaceutical tablets are currently an important emerging field in the pharmaceutical industry. Finding the distribution of the different compounds inside the tablet is an important issue for production quality control but also for counterfeit detection.Most of the currently used techniques are limited to the study of the surface of the compacts, whereas the study of the bulk requires a time-consuming sample preparation. In this paper, we present the use of 3D micro-X-ray fluorescence analysis (3D mu XRF) for the non-destructive study of pharmaceutical tablets.Based on two different examples, it was shown that it was possible to measure the distribution of several inorganic elements (Zn, Fe, Ti, Mn, Cu) from the surface to a depth of several hundred microns under the surface. The X-ray absorption, depending on both matrix composition and energy, is one of the most critical factors of this analytical method while performing depth profiling or mapping. Therefore, an original method to correct the absorption, in order to accurately measure the true elemental distribution, was proposed.Moreover, by using the presence of titanium dioxide in a pharmaceutical coating, we proved that this technique is also suited to the non-destructive measurement of coating thickness. (C) 2011 Elsevier B.V. All rights reserved.