ATML capabilities explained
ATML capabilities explained
复制标题
ATML 功能解释
DOI：
10.1109/autest.2007.4374218
复制
发表时间：
2007
期刊：
影响因子：
--
通讯作者：
D. Pleasant
中科院分区：
文献类型：
--
作者：
C. Gorringe;T. Lopes;D. Pleasant
本文介绍了ATML能力的主要概念，以及如何使用它们来描述仪器的性能和能力，使用简单的例子和用例。本文引导用户通过一组简单的日益复杂的问题，在每一步描述仪器和测试系统的能力，在一个标准的和可重复使用的方式。本文采用教程的形式，提出和解决日益复杂的仪器描述功能，每个步骤都有明确的解释和定义。每一步都集中在ATML能力标准的一个特定特征上，每一步都展示了如何通过一个有条理和一致的过程来描述真实的世界复杂系统。最后，本文认为，ATML功能可能对整个测试行业的影响，并提供了一些真实的和有形的好处，可能会实现的ATML功能的行业作为一个整体。
This paper describes the major concepts of ATML Capabilities and how they are used to describe instrument performance and capabilities, using simple examples and use cases. The paper leads the user through a simple set of increasingly complex problems, at each step describing instrument and test system capabilities in a standard and reusable manner. The paper takes the form of a tutorial, posing and solving increasingly complex instrument description capabilities, with each step clearly explained and defined. Each step concentrates on a particular feature of the ATML capability standard, and each step shows how real world complex systems can be described though a methodical and consistent process. Finally the paper considers the impact that ATML capabilities could have on the test industry as a whole, and offers some real and tangible benefits that may be achieved by the adoption of ATML capabilities by the industry as a whole.