Refinement of the Structure of MnSi by Powder Diffraction
Refinement of the Structure of MnSi by Powder Diffraction
复制标题
粉末衍射细化 MnSi 结构
作者：
J. Jørgensen;S. Rasmussen
本文报道了MnSi的晶体数据和结构细化的结果。该材料为立方晶系，P213，a = 4.5603（2）Mg/m3，Vd = 94.84（1）Mg/m3，Z = 4，Dx = 5.815 Mg/m3。强度数据由配备有位置敏感检测器的Stoe透射型衍射仪获得。采用CuKα1辐射，λ = 1.5405981 nm。锗用作测定晶格常数（aGe= 5.6582 Ω）的内标。通过Rietveld方法借助于三种不同的程序对结构进行了细化。
Abstract Crystal data and results of structure refinements for MnSi are reported. The material is cubic, P213, with a = 4.5603(2) Å, Vd = 94.84(1) Å3, Z = 4, Dx = 5.815 Mg/m3. Intensity data were obtained from a Stoe transmission type diffractometer equipped with a position sensitive detector. CuKα1 radiation, λ = 1.5405981 Å was employed. Germanium was used as an internal standard for the determination of the lattice constant (aGe= 5.6582 Å). The structure was refined by the Rietveld method by aid of three different programs.